H.AL-KAHYATT, Adel; ABASS, E.M.; OBAID, Y.N.; AL-ROWASS, .A.S. Studying the capacitance – voltage (C-V) characteristics for the metal- oxide-semiconductor field- effect transistor MOSFET fabricated by photolithography technique. Journal of Kufa-Physics, Kufa, Najaf, IRAQ, v. 1, n. 1, 2009. Disponível em: https://journal.uokufa.edu.iq/index.php/jkp/article/view/7531. Acesso em: 25 jun. 2026.