H.AL-Kahyatt, Adel, E.M. Abass, Y.N. Obaid, and .A.S. Al-Rowass. 2009. “Studying the Capacitance – Voltage (C-V) Characteristics for the Metal- Oxide-Semiconductor Field- Effect Transistor MOSFET Fabricated by Photolithography Technique”. Journal of Kufa-Physics 1 (1). https://journal.uokufa.edu.iq/index.php/jkp/article/view/7531.