The development and studies the current – voltage (I-V) characteristics for the metal- oxide-semiconductor

Authors

  • Adel H.AL-Kiat
  • E. M.Abass
  • Y.N. Obaid
  • A.S. Al-Rowass

Abstract

This paper contain the preparation of metal-oxide- semiconductor field- effect
transistor MOSFET by using the lightography technique. In this work we studied (IV)
characteristics and also some physical variables for transistor calculated.
The prepared transistor by using p- type silicon as a substrate has n-type channel
(nMOSFET) its length and width equal to L=50 μm ,Z = 1000μm . The results
showed that the output characteristics (ID-VD) and the trasfer charasteristics (ID-VG)
was in agreement with the theoretical behaviour of the transistor , and the transistor is
JOURNAL OF KUFA – PHYSICS Vol.3 NO.1(2011)
عادل حبيب عمران , أحسان محسه عباس , ياسيه وجم عبيد , أطياف صبحي الرواس
24
from the normally – on type nMOSFET depletion mode , with pinch – off voltage
equal to -4 volt .

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Published

2011-06-10

How to Cite

H.AL-Kiat, A., M.Abass, E., Obaid, Y., & Al-Rowass, A. (2011). The development and studies the current – voltage (I-V) characteristics for the metal- oxide-semiconductor. Journal of Kufa-Physics, 3(1). Retrieved from https://journal.uokufa.edu.iq/index.php/jkp/article/view/7509

Issue

Section

Peer-reviewed Articles